Reference Label	Details
note unc	The quoted uncertainty appeared to correspond to one std dev. and was multiplied by 2 to come closer to the desired 95% confidence limit
Thogersen 1996a	J. Thøgersen, L. D. Steele, M. Scheer, C. A. Brodie, and H. K. Haugen, J. Phys. B 29, 1323-1330 (1996) Electron Affinities of Si, Ge, Sn and Pt by Tunable Laser Photodetachment Studies