| Reference Label | Details |
|---|---|
| note unc | The quoted uncertainty appeared to correspond to one std dev. and was multiplied by 2 to come closer to the desired 95% confidence limit |
| Kandula 2010 | D. Z. Kandula, C. Gohle, T. J. Pinkert, W. Ubachs, and K. S. E. Eikema, Phys. Rev. Lett. 105, 063001/1-4 (2010) Extreme Ultraviolet Frequency Comb Metrology |