Reference Label | Details |
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note unc | The quoted uncertainty appeared to correspond to one std dev. and was multiplied by 2 to come closer to the desired 95% confidence limit |
Martin 1999d | J. M. L. Martin and P. R. Taylor, J. Phys. Chem. A (1999) A Definitive Heat of Vaporization of Silicon through Benchmark ab initio Calculations on SiF4 |