| Reference Label | Details |
|---|---|
| Valli 1999 | C. Valli, C. Blondel, and C. Delsart, Phys. Rev. A, 59, 3809-3815 (1999) Measuring Electron Affinities with the Photodetachment Microscope dx.doi.org/10.1103/PhysRevA.59.3809 |
| Blondel 2001a | C. Blondel, C. Delsart, C. Valli, S. Yiou, M. Godefroid, S. Van Eck, Phys. Rev. A 64, 052504/1-14 (2001) Electron Affinities of 16O, 17O, 18O, the Fine Structure of 16O-, and the Hyperfine Structure of 17O- |